All posts by Danny Nichols

FIDEX to be Presented at the 2009 NIEM National Training Event

FIDEXgraphicNFSTC’s Forensic Information Data Exchange (FIDEX) project has been selected for inclusion in the upcoming National Information Exchange Model (NIEM) Training Conference to be held in Baltimore, MD, from September 30 to October 2, 2009. The presentation, “Leveraging Existing NIEM and XML Standards: the Forensic Information Data Exchange (FIDEX) Project,” will provide results of a pilot implementation of FIDEX and demonstrate how FIDEX can be used to share information among agencies, streamlining forensic case submission and case disposition processes.

“FIDEX allows agencies to share NIEM compliant evidence information which can make operations much more efficient,” said Mike O’Berry of the NFSTC. “For instance, crime labs often find themselves entering evidence information multiple times during the forensic case submission process. With FIDEX, law enforcement can exchange case data from their system with the crime laboratory information management system (LIMS) electronically, eliminating duplication of effort and increasing the efficiency of the entire process.”

The FIDEX team includes Aaron Gorrell of Waterhole Software, Robin Wilson Jones of NIJ and Mike O’Berry of NFSTC. The team will discuss how agencies and crime labs can start using FIDEX for their own jurisdictions.

NFSTC Hosts Trace Evidence Symposium (August 3-7)

TraceEvidencelogoOver 300 members from all sectors of the justice community convened in Clearwater Beach, Florida recently to attend the Trace Evidence Symposium. This five-day conference brought together expert researchers and practitioners from throughout North America and Europe to share the latest information on using trace evidence to investigate and solve crimes.

The symposium included presentations focusing on a broad array of evidence including automotive paint, polymers, pollen, spores, tape, lamps, fabric and other materials that could prove crucial to solving a case. Attendee response was very positive. One participant shared the following praise, “I have been in the field of forensic science for an astonishingly long time . I’ve attended the Trace Symposium twice and both times, I have found that this symposium has been among the very best technical conferences I have attended over the course of those many, many years.”

To view select presentations from the 2009 Trace Evidence Symposium, visit: